US Patent 7249288 Method and apparatus for non-intrusive tracing
Patent 7249288 was granted and assigned to Freescale Semiconductor on July, 2007 by the United States Patent and Trademark Office.
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Patent Inventor Names
Avraham Horn0
Itay Peled0
Jacob Efrat0
Moshe Anschel0
Uri Dayan0
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Patent abstract
A method and apparatus non-intrusive tracing. The method includes: counting selected events by multiple counters; sampling the multiple counters to retrieve multiple counter values in response to predefined triggering events; receiving additional trace information that comprises at least one program counter value, and outputting, as a trace information, at least one of the multiple counters values and the additional trace information.
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US Patent 07249288 Method and apparatus for non-intrusive tracing US Patent 7249288 Method and apparatus for non-intrusive tracing
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Patent Number
072492880
Patent Number
72492880
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Is a
Current Assignee
Patent Jurisdiction
Patent Number
072492880
Date of Patent
July 24, 2007
0Patent Application Number
109402520
Date Filed
September 14, 2004
0Official Website
Patent Primary Examiner
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US Patent 07249288 Method and apparatus for non-intrusive tracing
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07249288
Date of patent
July 24, 2007
Patent application number
10940252
Date Filed
September 14, 2004
Patent primary examiner
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