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US Patent 7254507 Analog circuit automatic calibration system

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Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7254507
Date of Patent
August 7, 2007
Patent Application Number
10915345
Date Filed
August 11, 2004
Patent Citations Received
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US Patent 12123908 Loopback testing of integrated circuits
0
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US Patent 12013800 Die-to-die and chip-to-chip connectivity monitoring
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US Patent 12072376 Die-to-die connectivity monitoring
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US Patent 12092684 Integrated circuit workload, temperature, and/or sub-threshold leakage sensor
0
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US Patent 11762013 Integrated circuit profiling and anomaly detection
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US Patent 11762789 Integrated circuit I/O integrity and degradation monitoring
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US Patent 11841395 Integrated circuit margin measurement and failure prediction device
0
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US Patent 11929131 Memory device degradation monitoring
0
Patent Primary Examiner
‌
Manuel L. Barbee
Patent abstract

An analog circuit automatic calibration system for calibrating an object circuit that is an analog circuit having a characteristic changing with an input set value. The system includes: a set value storage section for storing a value and outputting the value to the object circuit as the set value; a characteristic detection section for detecting the characteristic of the object circuit; a first characteristic change section for determining the set value so that the characteristic of the object circuit is optimized; a second characteristic change section for updating the set value so that the characteristic of the object circuit is maintained, using an algorithm different from that used in the first characteristic change section; and a selector for selecting either one of the outputs of the first and second characteristic sections to enable the selected one to be stored in the set value storage section.

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