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US Patent 7256593 Electrical contact probe with compliant internal interconnect

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
June 8, 2006
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Date of Patent
August 14, 2007
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Patent Application Number
11450231
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Patent Citations Received
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US Patent 11973301 Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making
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US Patent 11867721 Probes with multiple springs, methods for making, and methods for using
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US Patent 11906549 Compliant pin probes with flat extension springs, methods for making, and methods for using
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US Patent 11906576 Contact assembly array and testing system having contact assembly array
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US Patent D1015282 Spring pin tip
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US Patent 11761982 Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
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US Patent 11777244 Socket connector having array of socket contacts
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US Patent 11774467 Method of in situ modulation of structural material properties and/or template shape
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US Patent 11802891 Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using
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US Patent 11867752 Contact assembly and kelvin testing system having contact assembly
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Patent Inventor Names
Valts Treibergs
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
7256593
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Patent Primary Examiner
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Ha Tran Nguyen
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