Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
August 14, 2007
Patent Application Number
11018540
Date Filed
December 21, 2004
Patent Primary Examiner
Patent abstract
A semiconductor device tester includes a parametric measurement unit (PMU) stage for producing a DC test signal and a pin electronics (PE) stage for producing an AC test signal to test a semiconductor device. A driver circuit is capable of providing a version of the DC test signal and a version of the AC test signal to the semiconductor device.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
