US Patent 7256879 Semiconductor array tester
Patent 7256879 was granted and assigned to Corning Incorporated on August, 2007 by the United States Patent and Trademark Office.
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Patent abstract
An array tester (10) characterizes individual ones (111) of a semiconductor devices of an array (11) based on polarization-resolving an optical far-field measurement of the individual chips (111) as a function of angular position. Two pairs of TM and TE detectors (41a-b and 42a-b) or one pair displaceable by ninety degrees, move in vertical and horizontal arc paths or fixed around a fixed position of a selected device of an array to sample the far-fields.
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US Patent 07256879 Semiconductor array tester US Patent 7256879 Semiconductor array tester
Infobox
Patent Number
0725687900
Patent Number
725687900
Edits on 2 Apr, 2023
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Infobox
Is a
Current Assignee
0
Patent Jurisdiction
Patent Number
072568790
Date of Patent
August 14, 2007
0Patent Application Number
107339030
Date Filed
December 11, 2003
0Official Website
Patent Primary Examiner
Edits on 27 Sep, 2022
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Infobox
Is a
Current Assignee
0
Patent Jurisdiction
Patent Number
072568790
Date of Patent
August 14, 2007
0Patent Application Number
107339030
Date Filed
December 11, 2003
0Official Website
Patent Primary Examiner
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US Patent 07256879 Semiconductor array tester
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07256879
Date of patent
August 14, 2007
Patent application number
10733903
Date Filed
December 11, 2003
Patent primary examiner
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