US Patent 7266027 Integrated semiconduct memory with test circuit
Patent 7266027 was granted and assigned to Infineon Technologies on September, 2007 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
September 27, 2005
Date of Patent
September 4, 2007
Patent Application Number
11235540
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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