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US Patent 7268894 Image measuring method, image measuring system and image measuring program

Patent 7268894 was granted and assigned to Mitutoyo on September, 2007 by the United States Patent and Trademark Office.

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Current Assignee
Mitutoyo
Mitutoyo
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
72688940
Patent Inventor Names
Hirato Sonobe0
Koichi Komatsu0
Sadayuki Matsumiya0
Date of Patent
September 11, 2007
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Patent Application Number
114376970
Date Filed
May 22, 2006
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Patent Primary Examiner
‌
Tarifur Chowdhury
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Patent abstract

An image measuring method comprises making no stop of an imaging means relative to a measurement stage at measurement positions (MP1-MP3), and capturing instantaneous images to acquire information required for measurement. A first direction to a measurement position (MP1) to be measured next and a second direction from the measurement position (MP1) to a next measurement position (MP2) form an angle therebetween. If this angle exceeds a certain angle, an overshoot path is formed at a location beyond the measurement position (MP1) in the first direction. The larger the angle formed between the first direction and the second direction, the lower the measurement speed at the measurement position (MP1) is made.

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