Patent attributes
A system, method and detection arrangement for investigation of a sample are described. A laser illumination arrangement generates (i) a source laser energy that is incident on a source to cause emission of subcentimeter radiation, at least a portion of which interacts with the sample to serve as a sample influenced radiation incident on a detector and (ii) a detector laser energy that is incident on the detector to produce an optical component of the detector laser energy offset with respect to a corresponding optical component of the source laser energy so that the collective energy at the detector generates an electrical output signal responsive to the sample influenced radiation. In another aspect, a detection arrangement is used with at least two continuous wave lasers for causing the detector body to respond in a way which produces a frequency down-converted signal from an incident electromagnetic radiation.
