Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Ian J. Forster0
Thomas C. Weakley0
Date of Patent
November 13, 2007
0Patent Application Number
111013520
Date Filed
April 7, 2005
0Patent Primary Examiner
Patent abstract
Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.
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