Patent attributes
The present invention reduces smears arising from voltage decreases caused by the wiring resistance of scan lines for electron emission device selection. The display unit includes an FED panel in which scan lines, data lines, and electron supply devices are positioned at the intersections of the data lines and scan-lines. A scan driver for supplying a selection signal to the scan lines, and a data driver for supplying a drive signal to the data lines are provided. Electron emission devices selected by the selection signal are driven by the drive signal. A signal corrector circuit individually corrects the drive signal to be supplied to each data line to compensate for a voltage decrease caused by the wiring resistance in each column of the scan lines.
