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US Patent 7298463 Automated system and method for optical measurement and testing

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Is a
Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
72984630
Patent Inventor Names
John Sargent French0
William Joseph Thompson0
Date of Patent
November 20, 2007
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Patent Application Number
106132930
Date Filed
July 3, 2003
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Patent Citations Received
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US Patent 11940889 Combined TDECQ measurement and transmitter tuning using machine learning
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US Patent 11907090 Machine learning for taps to accelerate TDECQ and other measurements
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US Patent 11923896 Optical transceiver tuning using machine learning
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US Patent 11923895 Optical transmitter tuning using machine learning and reference parameters
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Patent Primary Examiner
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Tu T. Nguyen
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Patent abstract

A system and method for bit error rate testing optical components comprises providing an optical testing unit, which measures a bit error rate of an optical device under test (DUT) over an operating range of the DUT. The optical testing unit includes an optical transmitter, which transmits an optical test signal that is transmitted to the DUT; an optical receiver, which receives an input signal from the DUT; a graphical user interface, which provides an interface with a user; and a controller, selectively coupled to the transmitter, the receiver and the graphical user interface, wherein the controller provides a central control of the transmitter, the receiver and the graphical user interface.

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