US Patent 7301357 Inspection method and inspection equipment
Patent 7301357 was granted and assigned to Tokyo Electron on November, 2007 by the United States Patent and Trademark Office.
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Patent abstract
In an inspection method according to the invention, a plurality of drivers 21 incorporated in a tester 20 apply a fritting voltage to respective electrodes P via first probe pins 11A included in pairs of first and second probe pins 11A and 11B and connected to the respective drivers.
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US Patent 07301357 Inspection method and inspection equipment US Patent 7301357 Inspection method and inspection equipment
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Patent Number
0730135700
Patent Number
730135700
Edits on 26 Apr, 2023
Golden AI
Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
073013570
Date of Patent
November 27, 2007
0Patent Application Number
105387850
Date Filed
December 9, 2003
0Official Website
Patent Primary Examiner
Edits on 26 Sep, 2022
Golden AI
Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
073013570
Date of Patent
November 27, 2007
0Patent Application Number
105387850
Date Filed
December 9, 2003
0Official Website
Patent Primary Examiner
Edits on 17 Jun, 2022
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US Patent 07301357 Inspection method and inspection equipment
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07301357
Date of patent
November 27, 2007
Patent application number
10538785
Date Filed
December 9, 2003
Patent primary examiner
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