Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kei-Wei Chen0
Ting-Chun Wang0
Ying-Lang Wang0
Yu-Ku Lin0
Ching-Hwan Su0
Shih-Ho Lin0
Shih-Tzung Chang0
Date of Patent
December 4, 2007
Patent Application Number
10942554
Date Filed
September 15, 2004
Patent Primary Examiner
Patent abstract
A novel test device and method for calibrating the alignment of a laser beam emitted from a laser metrology tool with respect to a target area on a substrate. The test device includes a laser-sensitive material having a calibration pattern that includes a target point. When the tool is properly adjusted, the laser beam strikes the target point and is released to production. If the laser beam misses the target point, the tool is re-adjusted and re-tested until the laser beam strikes the target point.
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