US Patent 7308371 Bit error rate testing for high-speed devices

Patent 7308371 was granted and assigned to Intel on December, 2007 by the United States Patent and Trademark Office.

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Patent Number

Date of Patent

December 11, 2007

Patent Application Number

10868243

Date Filed

June 15, 2004

Patent Primary Examiner

Patent abstract

A method and system for performing a bit error rate test on a device with substantial duty cycle output distortion are described herein.

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