Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Chian Chiu Li0
Date of Patent
December 18, 2007
Patent Application Number
11161892
Date Filed
August 22, 2005
Patent Citations Received
Patent Primary Examiner
Patent abstract
A system and method of optical reflectometry and optical coherence tomography (OCT) is provided by using a wavefront-division interferometer where a beam is split into side-by-side beam portions. The interference is tuned by changing the phase difference between the beam portions. The interference contrast is adjusted by changing the ratio of the beam portions. The structure of the optical reflectometry and OCT is compact and insensitive to environmental changes. Methods are also provided for multi-level and multi-layer optical data storage systems.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.