US Patent 7324217 Device and method for measuring components

A method is disclosed for measuring components (1) using a measurement system (20) guided by a manipulator (10). In this process, reference features (9, 9a, . . . , 9i) are decentrally located at various positions near a component (1) to be measured, the reference features each being assigned to at least one measuring object (6) located at a close distance to the particular reference feature (9, 9a, . . . , 9i) on the component (1) to be measured. Before a test object (6) is measured, the measuring system (20) is first brought into a calibration position using the manipulator (10), and the reference feature (9, 9a, . . . , 9i) assigned to the particular test object (6) is measured using the measuring system (20) to calibrate a coordinate system of the manipulator (10). Using the manipulator (10), the measuring system (20) is then moved into a measurement position, where the relevant test object (6) is measured. A corresponding device for measuring components and a component carrier (7) are also disclosed.