US Patent 7327610 DRAM memory with common pre-charger

A memory layout where the pre-charger circuits are connected between different pairs of bit lines than are the sense amplifiers: The two bits lines in each bit line pair are connected to different pre-charge circuits and thus they can be charged to different pre-charge voltages. That is, the bit line and bit line bar sense lines in each bit line pair are connected to different pre-charge circuits. With this configuration it is possible to perform a sense stress test by activating all of the address lines at the same time and to charge to bit line and the bit bar line in each pair of sense lines to different voltages. With this configuration it is possible to reduce the number of test pads required.