There is provided a nozzle apparatus for stripping an edge bead from a wafer, which includes a rotatable support arm, and a side rinse nozzle coupled to a leading end of the support arm to remove the bead of photoresist remaining on the edge of a wafer. The side rinse nozzle has a first nozzle for removing the bead on the upper surface of the wafer edge, and a second nozzle for removing the bead on the outer end surface of the wafer. The first and second nozzles each have a shape such that a length thereof is long in a radial direction of the wafer and a width thereof is narrow.