Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Shobhana Mani0
Todd Alan Anderson0
David Mulford Shaddock0
Emad Andarawis Andarawis0
Jie Jiang0
Mahadevan Balasubramaniam0
Samhita Dasgupta0
Date of Patent
February 19, 2008
0Patent Application Number
111674340
Date Filed
June 27, 2005
0Patent Primary Examiner
Patent abstract
A clearance measurement system is provided. The clearance measurement system includes a reference geometry disposed on a first object having an otherwise continuous surface geometry and a sensor disposed on a second object, wherein the sensor is configured to generate a first signal representative of a first sensed parameter from the first object and a second signal representative of a second sensed parameter from the reference geometry. The clearance measurement system also includes a processing unit configured to process the first and second signals to estimate a clearance between the first and second objects based upon a measurement difference between the first and second sensed parameters.
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