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US Patent 7336359 System and method for nonlinear optical null ellipsometry

Patent 7336359 was granted and assigned to Purdue Research Foundation on February, 2008 by the United States Patent and Trademark Office.

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Patent Citations Received
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US Patent 11821834 Method and apparatus for measuring three-dimensional refractive index tensor
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Patent Inventor Names
Garth J. Simpson0
Mark Polizzi0
Ryan M. Plocinik0
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Patent abstract

Nonlinear optical null ellipsometry is disclosed as a method to evaluate second-order nonlinearities on and off resonance in thin surface films and bulk materials.

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US Patent 11692270 System for surface modification by laser diffusion
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US Patent 07336359 System and method for nonlinear optical null ellipsometry US Patent 7336359 System and method for nonlinear optical null ellipsometry

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Patent Number
073363590
Patent Number
73363590
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=073363590
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Infobox
Is a
Patent
Patent
0
Current Assignee
Purdue Research Foundation
Purdue Research Foundation
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
073363590
Date of Patent
February 26, 2008
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Patent Application Number
111203500
Date Filed
May 3, 2005
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=073363590
Patent Primary Examiner
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Akm Ullah
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07336359
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 US Patent 07336359 System and method for nonlinear optical null ellipsometry

Infobox
Is a
Patent
Patent
Current assignee
Purdue Research Foundation
Purdue Research Foundation
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07336359
Date of patent
February 26, 2008
Patent application number
11120350
Date Filed
May 3, 2005
Patent primary examiner
‌
Akm Ullah

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