Patent attributes
An improved moiré deflectometer device for measuring a wavefront aberration of an optical system includes a light source for illuminating a surface area of the optical system, an optical relay system for directing scattered light to a deflectometer component that converts the wavefront into a moiré fringe pattern, a sensor/camera assembly for imaging and displaying the exit pupil of the optical system and the moiré´ fringe pattern, and a fringe pattern to calculate the wavefront aberration of the optical system, being improved by an illumination source for illuminating the exit pupil of the optical system; and an alignment system cooperating with the illumination source in such a manner to consistently and accurately align a measurement axis of the device to the optical system. An associated method is also disclosed.
