US Patent 7343076 Alignment apparatus for use in testing optical modules
Patent 7343076 was granted and assigned to Hon Hai Precision Industry Co Ltd on March, 2008 by the United States Patent and Trademark Office.
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An exemplary optical module testing apparatus (100) includes a base (10) and a supporting element (20). The base has a testing hole (13) formed thereon. The supporting element has a plurality of supporting portions (23) formed thereon. The supporting element is slideably disposed on the base in such a manner that the supporting portions can be selectively aligned with the testing hole. The supporting portions are configured for supporting optical modules. The base has an upper surface (11), and a slide groove (12) is formed on the upper surface, and two slide slots (121) are formed on two sides of the slide groove.
US Patent 07343076 Alignment apparatus for use in testing optical modules US Patent 7343076 Alignment apparatus for use in testing optical modules
US Patent 07343076 Alignment apparatus for use in testing optical modules
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