Patent 7343520 was granted and assigned to Raytheon on March, 2008 by the United States Patent and Trademark Office.
A method for conducting a built in test on a system having a central processing unit (CPU), connected to one or more storage means, an input/output means and a plurality of assemblies PCI1, PCI2 . . . PCIN to be tested. A test initiator, generally a system wide operating system running on a system CPU, starts the test. Each of the assemblies to be tested has an identified and a test requirement, presented in a format common for, and applicable to, a plurality of central processing units and associated assemblies.