Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Toshihide Kadota0
Date of Patent
March 11, 2008
Patent Application Number
11094970
Date Filed
March 31, 2005
Patent Primary Examiner
Patent abstract
A method and system for measuring a device under test includes connecting a first test instrument and a second test instrument to a programmable logic device. The programmable logic device is configured to comply with interface specifications of the first test instrument. The second test instrument has interface specifications that are different from the interface specifications of the first test instrument. The programmable logic device is configured to comply with the interface specifications of the second test instrument.
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