US Patent 7345493 Wafer-level burn-in and test
Patent 7345493 was granted and assigned to FormFactor on March, 2008 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
July 18, 2006
0
Date of Patent
March 18, 2008
0
Patent Application Number
11458375
0
Patent Inventor Names
David V. Pedersen
0
Igor Y. Khandros
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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