US Patent 7350170 System and method for memory element characterization

A system and method for analyzing a memory element includes modeling the memory element using a simulation method and determining component response characteristics for components of the memory element. Safety regions are computed in a state space of the memory element, which indicate stable states. A transient analysis is performed to determine a path and time needed to reach one of the safety regions. Based on the path and time needed to reach one of the safety regions, a clock waveform or waveforms are determined which place a corresponding state in that safety region.