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US Patent 7356430 Methods and apparatus for data analysis

Patent 7356430 was granted and assigned to Test Advantage on April, 2008 by the United States Patent and Trademark Office.

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Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

Patent Inventor Names

Michael J. Scott0

Paul Buxton0

Paul Tabor0

Emilio Miguelanez0

Jacky Gorin0

Date of Patent

April 8, 2008

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Patent Application Number

110535980

Date Filed

February 7, 2005

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Patent Citations Received

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Patent Primary Examiner

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Patent abstract

A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.

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