Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Chih-Jen M. Lin0
Zhuoyu Bao0
David M. Wu0
Date of Patent
May 6, 2008
Patent Application Number
10874718
Date Filed
June 22, 2004
Patent Primary Examiner
Patent abstract
A technique for testing a memory array. More particularly, embodiments of the invention relate to a memory array testing architecture in which a memory array within a device under test (DUT) is able to be tested at speeds substantially similar to those under typical operating conditions of the memory array without incurring significant die real estate and power penalties.
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