US Patent 7374721 Chip with measuring reliability and a method thereof
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Patent Inventor Names
Kuo-Jeng Wang0
Yin-Chun Huang0
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Patent abstract
A chip with measuring reliability and a method thereof are provided. The present invention serially connects a resistor having a resistance equal to or a little more than a maximum resistance of the chip itself to the resistor Rs of the chip so as to compensate the resistance differences among chips. A noise to signal (N/S) ratio of the chip is decreased, and a measuring reliability of the chip is improved.
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US Patent 07374721 Chip with measuring reliability and a method thereof US Patent 7374721 Chip with measuring reliability and a method thereof
Infobox
Patent Number
073747210
Patent Number
73747210
Edits on 26 Apr, 2023
Golden AI
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Patent Jurisdiction
Patent Number
073747210
Date of Patent
May 20, 2008
0Patent Application Number
107265340
Date Filed
December 4, 2003
0Official Website
Patent Primary Examiner
Edits on 17 Jun, 2022
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Edits on 29 Nov, 2021
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US Patent 07374721 Chip with measuring reliability and a method thereof
Infobox
Is a
Patent jurisdiction
Patent number
07374721
Date of patent
May 20, 2008
Patent application number
10726534
Date Filed
December 4, 2003
Patent primary examiner
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