US Patent 7386411 Automatic hi-pot test apparatus and method

An exemplary automatic hi-pot test apparatus (20) includes a high voltage supply (21), a transmission device configured for transmitting an electronic device (26) to be tested, a connecting device electrically connected to the high voltage supply and configured for moving and electrically connecting with or electrically disconnecting from the electronic device, a controller (28) for controlling the connecting device and the transmission device, and a detector (27) for detecting the presence of the electronic device. When the detector detects the presence of the electronic device, the detector sends a corresponding detecting signal to the controller, such that the controller stops the electronic device and drives the connecting device to electrically connect with the electronic device whereby a hi-pot test can be performed. When the hi-pot test is finished, the controller drives the connecting device to disconnect from the electronic device whereby the electronic device can transmit elsewhere by operation of the transmission device.