Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Steffen Gerlach0
Date of Patent
June 17, 2008
0Patent Application Number
108921190
Date Filed
July 16, 2004
0Patent Primary Examiner
Patent abstract
A method for measuring overlay shift is disclosed. An image is acquired of at least one reference element that comprises at least one first pattern element in a first plane and at least one second pattern element in a second plane. An image of a measurement element is likewise acquired. The shift value between the reference element and measurement element is ascertained by comparing the image of the reference element with the image of the measurement element. An output on a user interface indicates whether a predefined tolerance value is being exceeded.
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