US Patent 7388447 Integrated clock generator tolerant to device parameter variation

A method and circuit for stabilizing a frequency of a clock generator comprising a ring oscillator with respect to manufacturing process variations and a circuit temperature. A bias circuit comprising a current mirror and cascade circuits provides a compensated bias current based on a gate source voltage and drain source voltage of an output transistor, where the two voltages are independent of transistor parameters and circuit temperature. As a result, the ring oscillator frequency is stabilized with respect to those parameters.