US Patent 7397235 Pin electronic for automatic testing of integrated circuits

A pin electronic adapted for use in an automatic test equipment for testing integrated circuits ICs includes a driver circuit having an input for receiving an input signal from a data source and an output connected with an input pin of a device under test, and a feedback circuit having at least one input, which receives an input voltage or current at the input pin of the DUT, and an output. The feedback circuit is adapted to provide a voltage in order to force a substantially constant voltage or current at the input pin of the DUT, and a switching device for alternatively connecting the input of the driver circuit with the data source or the output of the feedback circuit.