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US Patent 7399711 Method for controlling a recess etch process

Patent 7399711 was granted and assigned to Lam Research on July, 2008 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Lam Research
Lam Research
Date Filed
November 1, 2002
Date of Patent
July 15, 2008
Patent Application Number
10286409
Patent Citations Received
‌
US Patent 11965798 Endpoint detection system for enhanced spectral data collection
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7399711
Patent Primary Examiner
‌
George A. Goudreau

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