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Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
July 15, 2008
Patent Application Number
10488604
Date Filed
August 23, 2002
Patent Primary Examiner
Patent abstract
The present invention provides methods for the use of visible and/or near-infrared spectroscopic methodology to monitor and control processes for the generation of particles, including processes that provide for a reduction in particle size and processes that result in an increase in particle size. One embodiment of the present invention employs visible and/or near-infrared diffuse reflectance spectroscopy to monitor particle size. The present invention is particularly useful for monitoring particle size of optically dense samples and is further useful for monitoring the endpoint of particle generation processes. In contrast to methods known in the art, the present invention is especially useful for on-line monitoring of particle size.
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