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US Patent 7401012 Method and apparatus for characterizing computer system workloads

Patent 7401012 was granted and assigned to Sun Microsystems on July, 2008 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee
Sun Microsystems
Sun Microsystems
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7401012
Date of Patent
July 15, 2008
Patent Application Number
11111152
Date Filed
April 20, 2005
Patent Citations Received
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US Patent 11978000 System and method for determining a decision-making strategy
0
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US Patent 11790632 Method and apparatus for sample labeling, and method and apparatus for identifying damage classification
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US Patent 11789809 Streaming server statistics and predictive mitigation
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US Patent 11876731 System and methods for sharing memory subsystem resources among datacenter applications
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US Patent 11748399 System and method for training a damage identification model
Patent Primary Examiner
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Kamini S Shah
Patent abstract

One embodiment of the present invention provides a system that characterizes computer system workloads. During operation, the system collects metrics for a number of workloads of interest as the workloads of interest execute on a computer system. Next, the system uses the collected metrics to build a statistical regression model, wherein the statistical regression model uses a performance indicator as a response, and uses the metrics as predictors. The system then defines a distance metric between workloads, wherein the distance between two workloads is a function of the differences between metric values for the two workloads. Furthermore, these differences are weighted by corresponding coefficients for the metric values in the statistical regression model.

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