US Patent 7401277 Semiconductor integrated circuit and scan test method therefor

A method for performing scan test on a semiconductor integrated circuit including at least two blocks to be tested. The method includes isolating each of the at least two blocks to be tested exclusively from further blocks; and supplying a plurality of scan clocks having different phases each to each of the at least two blocks. In addition, a semiconductor integrated circuit includes at least two blocks to be tested, an Core Wrapper Architecture isolation unit for isolating each of the at least two blocks to be tested exclusively from further blocks, and an input terminal for inputting a plurality of scan clocks each to each of the at least two blocks, in which a Wrapper register included in the Core Wrapper Architecture is configured to be supplied selectively with one of a scan clock and a system clock for the blocks.