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US Patent 7401498 Multiple trace portal detection systems

Patent 7401498 was granted and assigned to SYAGEN TECHNOLOGY INC on July, 2008 by the United States Patent and Trademark Office.

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Patent abstract

A detector system that can analyze multiple samples with a single detector. The detector may contain a portal with a first opening and a second opening. A first sample is obtained from the first opening and a second sample is obtained from the second opening. The openings are coupled to a single detector that can analyze both samples.

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