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US Patent 7408378 Calibration methods and circuits for optimized on-die termination

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Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7408378
Patent Inventor Names
Scott C. Best0
Anthony Koon Wong0
David Leung0
Date of Patent
August 5, 2008
Patent Application Number
11286229
Date Filed
November 23, 2005
Patent Citations Received
‌
US Patent 11792052 Semiconductor apparatus including calibration circuit
‌
US Patent RE49783 Nonvolatile semiconductor memory device and memory system having termination circuit with variable resistor
0
‌
US Patent 11664907 Periodic calibration for communication channels by drift tracking
0
Patent Primary Examiner
‌
Daniel D Chang
Patent abstract

Described are on-die termination (ODT) systems and methods that facilitate high-speed communication between a transmitter die and a receiver die interconnected via one or more signal transmission lines. An ODT control system in accordance with one embodiment calibrates and maintains the termination resistances for the signal transmission lines. The ODT control system derives a number of calibration currents from precision voltage and resistance references and distributes the reference currents to a number of transmitters. Each transmitter then derives an ODT calibration signal using the respective reference current and another precision resistor, and then employs the calibration signal to calibrate local termination elements. Distributing calibrated currents provides excellent noise immunity, while limiting the requisite number of external voltage references reduces cost.

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