Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
August 5, 2008
Patent Application Number
11853956
Date Filed
September 12, 2007
Patent Primary Examiner
Patent abstract
An impedance calibration circuit and a semiconductor device including the same are provided. An embodiment of the invention provides an impedance calibration circuit with a variable reference voltage generation unit. The impedance calibration circuit maximizes the number of semiconductor devices that can be tested in test equipment at one time and permits the operation of an impedance matching unit (e.g., an on-die-termination (ODT) circuit and/or an off-chip-driver (OCD)) to be tested for a variety of reference resistor values.
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