A memory cell and a method of fabricating the same. A first conductive layer on a substrate is provided and a first type doped semiconductor layer is then formed on the first conductive layer. The first type doped semiconductor layer and the first conductive layer are patterned into a first line. A dielectric layer is formed on the substrate with an opening exposing the first line. A column comprising a second diode component, a buffer layer, and an anti-fuse layer is formed in the opening. A second line is formed connecting the column on the dielectric layer running generally perpendicularly to the first line.