Patent attributes
An apparatus for measuring web planarity includes a horizontal reference surface and a light source for projecting a light pattern onto the reference surface at an angle. A web is supported above the reference surface. An imaging device detects (1) positions on the reference plane of interception of discrete regions of the projected light pattern and (2) respective positions on the web of interception of the same discrete regions of the projected light pattern. The imaging device determines the vertical offset of the respective positions on the web as a function of differences in the detected positions on the reference plane and the respective detected positions on the web. A measure of non-planarity of the web is calculated based upon a comparison of a plurality of such vertical offsets from a plurality of detected positions of the web.
