Patent 7424382 was granted and assigned to Agilent Technologies on September, 2008 by the United States Patent and Trademark Office.
Systems and methods of characterizing eye diagrams are described. In one aspect, at measurement times across a measurement interval spanning at least one unit interval of the input signal, corresponding levels of the input signal are classified into groups based on at least one threshold. An eye diagram characteristic width is derived based on a distribution across the measurement interval of the levels in one of the groups.