It is provided a semiconductor device with an ability to receive various test signals and check test results in spite of a limited number of pads. The semiconductor device includes a signal transferring unit for transferring a power signal input through a multipurpose pad into a core area or delivering a test signal between the multipurpose pad and the core area while operating in a test mode and a test mode controlling unit for controlling the signal transferring unit to transfer one of the power voltage and the test signal.