Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Wu-Tung Cheng0
Xiaogang Du0
Nilanjan Mukherjee0
Date of Patent
September 16, 2008
Patent Application Number
11283499
Date Filed
November 18, 2005
Patent Primary Examiner
Patent abstract
Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
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