US Patent 7433119 Scanning microscope
Patent 7433119 was granted and assigned to Leica Microsystems on October, 2008 by the United States Patent and Trademark Office.
All edits
Edits on 17 Sep, 2023
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Inventor Names
Hilmar Gugel0
Edits on 15 Sep, 2023
Golden AI
Edits made to:
Article (+279 characters)
Article
Patent abstract
In a scanning microscope that impinges upon a sample with a first light pulse and a second light pulse, a dispersive medium that modifies the time offset between the first and the second light pulse is provided in the beam path of at least one of the light pulses.
Edits on 23 May, 2023
Golden AI
Edits made to:
Infobox (+1/-1 properties)
US Patent 07433119 Scanning microscope US Patent 7433119 Scanning microscope
Infobox
Patent Number
074331190
Patent Number
74331190
Edits on 21 May, 2023
Golden AI
Edits made to:
Infobox (-1 properties)
Infobox
Official Website
Edits on 28 Sep, 2022
Golden AI
Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
074331190
Date of Patent
October 7, 2008
0Patent Application Number
109629590
Date Filed
October 12, 2004
0Official Website
Patent Primary Examiner
Edits on 14 Jun, 2022
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Website URL
Edits on 1 Dec, 2021
Golden AI
Edits made to:
Infobox (+8 properties)
US Patent 07433119 Scanning microscope
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07433119
Date of patent
October 7, 2008
Patent application number
10962959
Date Filed
October 12, 2004
Patent primary examiner
Find more entities like US Patent 7433119 Scanning microscope
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
