Patent 7436927 was granted and assigned to Siemens Aktiengesellschaft on October, 2008 by the United States Patent and Trademark Office.
An imaging apparatus has an examination space in which a region of an examination subject to be examined can be positioned as well as an optical image acquisition sensor, which is provided to acquire a surface of the examination subject in the examination space and which is linked with an evaluation unit such that acquired surface data are provided as control information for controlling an image acquisition unit, in particular an x-ray device.