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US Patent 7444263 Performance metric collection and automated analysis

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Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
74442630
Patent Inventor Names
John J. McGee0
David Ronald White0
Earl Charles LaBatt, Jr.0
Edward W. Macomber0
Steven J. Baron0
Date of Patent
October 28, 2008
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Patent Application Number
118323190
Date Filed
August 1, 2007
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Patent Citations Received
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US Patent 12026086 Debugging operator errors in a distributed computing environment
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US Patent 11671321 Method for generating network optimizing information
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US Patent 11716248 Selective event stream data storage based on network traffic volume
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US Patent 11803433 Localization of potential issues to objects
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US Patent 11863408 Generating event streams including modified network data monitored by remote capture agents
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US Patent 11936764 Generating event streams based on application-layer events captured by remote capture agents
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US Patent 11936664 Identity attack detection and blocking
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US Patent 11973852 Generating event data at remote capture agents based on identified network addresses
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...
Patent Primary Examiner
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Edward Raymond
0
Patent abstract

A metric monitoring and analysis system including dynamic sampling agents located in monitored system elements and a service management platform. Each sampling agent includes a data adapter collecting metric data in a common format, a threshold generator for determining dynamic metric threshold ranges, an alarm detector generating an indicator when a metric deviates outside a dynamic threshold range or a static threshold, and a deviation tracker generating an alarm severity scores. The service platform includes an alarm analyzer identifying root causes of system alarm conditions by correlation of grouped metrics or forensic analysis of temporally or statistically correlated secondary forensic data or data items from a service model of the system.

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