US Patent 7449902 Probe system
Patent 7449902 was granted and assigned to Powerchip Semiconductor on November, 2008 by the United States Patent and Trademark Office.
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Patent Inventor Names
Fan-Hsien Hsu0
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Patent abstract
A probe apparatus and a probe system are provided. The probe apparatus uses a larger printed circuit board to dispose a plurality of testers. The layout of each of the testers on the circuit board is modified accordingly, such that more number of the testers can be disposed on the circuit board and the pin count of the probe apparatus is increased. In addition, the probe apparatus can be installed in the test tool. Accordingly, the testing efficiency of the present test tool can be substantially promoted and the cost of the overall testing can be effectively reduced.
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US Patent 07449902 Probe system US Patent 7449902 Probe system
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Patent Number
07449902
Patent Number
7449902
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Official Website
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US Patent 07449902 Probe system
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Is a
Current assignee
Patent jurisdiction
Patent number
07449902
Date of patent
November 11, 2008
Patent application number
11762065
Date Filed
June 13, 2007
Patent primary examiner
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