Patent attributes
An improved chromatographic method for measuring impurities in a gas sample that allows extraction of a peak of impurity masked by the sample background. An impurity peak is extracted from the sample background and put in a second sample loop and the second sample loop volume is injected into a second separation column. A “slice” is taken from the sample background to fill the second sample loop and the “slice”, whose width is preferably substantially equal to the impurities peak width, is injected into the second separation column. Another embodiment allows concentration of a predetermined impurity, thereby providing an improved precision on the results. The chromatographic method provides an improved measure of argon in oxygen, oxygen in argon and oxygen in hydrogen.
